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Crystallographic orientation of Cr in longitudinal recording media and its relation to magnetic anisotropy

2002; American Institute of Physics; Volume: 81; Issue: 8 Linguagem: Inglês

10.1063/1.1500433

1520-8842

Antony Ajan, Iwao Okamoto,

Copper Interconnects and Reliability

A specific growth of Cr layer grains is found to exist when grown on the mechanically textured NiP–Al substrates used for longitudinal recording. High resolution transmission electron microscopy analysis of a large number of individual Cr grains indicate a Cr[110] preferential growth along the textured direction (groove or circumferential direction). This particular orientation of the Cr underlayer is found to be the cause of an in-plane magnetic anisotropy of the Co based magnetic layer. The temperature dependence of this in-plane magnetic anisotropy study indicated the importance of the specific crystallographic orientations of both the underlayer and the magnetic layer.