X-ray characterization of tungsten single crystals grown by secondary recrystallization method
1991; Elsevier BV; Volume: 112; Issue: 2-3 Linguagem: Inglês
10.1016/0022-0248(91)90312-s
ISSN1873-5002
AutoresMasahiro Katoh, Satoshi Iida, Yoshimitsu Sugita, Ken‐ichi Okamoto,
Tópico(s)Fusion materials and technologies
ResumoTungsten single crystals grown by the secondary recrystallization method from hot-rolled tungsten plates doped with CaO and/or MgO have been characterized by the Berg-Barrett method and the X-ray double crystal method. The perfection of the crystals was found to be better than that of a tungsten single crystal grown by the conventional electron beam zone melting method.
Referência(s)