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Growth and characterization of polar and nonpolar ZnO film grown on sapphire substrates by using atomic layer deposition

2013; Elsevier BV; Volume: 546; Linguagem: Inglês

10.1016/j.tsf.2013.03.071

1879-2731

K. W. Kim, Hyo-Soo Son, Nak-Jung Choi, Jihoon Kim, Sung‐Nam Lee,

Gas Sensing Nanomaterials and Sensors

Abstract We investigated the electrical and the optical properties of polar and nonpolar ZnO films grown on sapphire substrates with different crystallographic planes. High resolution X-ray results revealed that polar c-plane (0001), nonpolar m-plane (10-10) and a-plane (11-20) ZnO thin films were grown on c-plane, m- and r-sapphire substrates by atomic layer deposition, respectively. Compared with the c-plane ZnO film, nonpolar m-plane and a-plane ZnO films showed smaller surface roughness and anisotropic surface structures. Regardless of ZnO crystal planes, room temperature photoluminescence spectra represented two emissions which consisted of the near bandedge (~ 380 nm) and the deep level emission (~ 500 nm). The a-plane ZnO films represented better optical and electrical properties than c-plane ZnO, while m-plane ZnO films exhibited poorer optical and electrical properties than c-plane ZnO.