GISAXS/GIXRD View of ZnO Films with Hierarchical Structural Elements
2012; Hindawi Publishing Corporation; Volume: 2012; Linguagem: Inglês
10.1155/2012/354809
ISSN1687-9511
AutoresMagdy Lučić Lavčević, Sigrid Bernstorff, Pavo Dubček, Dražan Jozić, Igor Jerković, Zvonimir Marijanović,
Tópico(s)Gas Sensing Nanomaterials and Sensors
ResumoZnO films constituted of porous sheet-like structures, formed by calcination of precursor, were examined using scanning electron microscopy and simultaneous small-angle scattering and diffraction of the synchrotron-sourced X-rays, under the grazing-incidence conditions. The presented analysis enabled insight into the complexity of the film morphology, which revealed substrate sensitivity on the microscopic and nanoscopic length scales. The average size and spatial arrangement of nanoparticles, single-crystal domains, and the average size and features of nanopores in sheet-like structures were determined for films deposited on glass, polycrystalline ZnO layer, and silicon.
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