Portal de Periódicos da CAPES

Piezoresponse Force Microscopy Studies of Switching Behavior of Ferroelectric Capacitors on a 100-ns Time Scale

2008; American Physical Society; Volume: 100; Issue: 9 Linguagem: Inglês

10.1103/physrevlett.100.097601

1092-0145

A. Gruverman, Depei Wu, J. F. Scott,

Semiconductor materials and devices

Piezoresponse force microscopy is a powerful technique for nm-scale studies but is usually limited by response time. In this Letter, we report the first direct studies of ferroelectric capacitor switching on a submicrosecond time scale. Simultaneous domain imaging and sub-$\ensuremath{\mu}\mathrm{s}$ transient current measurements establish a direct relationship between polarization $P(t)$ and domain kinetics. Switching times scale with capacitor size over an order of magnitude. Small capacitors, where polarization reversal is dominated by domain wall motion, switch faster at high fields but more slowly at low fields while larger capacitors do the reverse.