X-Ray Interferometry with Microelectronvolt Resolution
2003; American Physical Society; Volume: 90; Issue: 1 Linguagem: Inglês
10.1103/physrevlett.90.013904
ISSN1092-0145
AutoresYuri Shvyd’ko, M. Lerche, Hans‐Christian Wille, E. Gerdau, M. Lucht, H. D. Rüter, E. Ercan, Ruben Khachatryan,
Tópico(s)Advanced X-ray Imaging Techniques
ResumoWe demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors--a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76 mu eV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.
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