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Measurement of transfer efficiency of charge-coupled devices

1971; Institute of Electrical and Electronics Engineers; Volume: 6; Issue: 6 Linguagem: Inglês

10.1109/jssc.1971.1050220

1558-173X

J. Berger, J.S. Brugler, R. Melen,

Advancements in Semiconductor Devices and Circuit Design

A simple method for measuring the transfer efficiency of charge- coupled devices is described. It is based on the effect of charge pumping in MOS devices and has the advantages that (1) it requires a simple device and simple pulsing circuitry; and (2) the lost charge is evaluated from d.c. measurement.