Investigations of Possible Nitrogen Participation in the Z<sub>1</sub>/Z<sub>2</sub> Defect in 4H-SiC
2004; Trans Tech Publications; Volume: 457-460; Linguagem: Inglês
10.4028/www.scientific.net/msf.457-460.469
ISSN1662-9760
AutoresL. Storasta, Anne Henry, Peder Bergman, Erik Janzén,
Tópico(s)Copper Interconnects and Reliability
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