Scanning reflection electron micrographs of stacking faults in a Co-4wt% Ti alloy
1974; Wiley; Volume: 21; Issue: 1 Linguagem: Inglês
10.1002/pssa.2210210144
ISSN1521-396X
AutoresDavid C. Joy, M.N. Thompson, G. R. Booker, W. H. Andersen,
Tópico(s)Metallurgical and Alloy Processes
Resumophysica status solidi (a)Volume 21, Issue 1 p. K1-K5 Short Note Scanning reflection electron micrographs of stacking faults in a Co-4wt% Ti alloy D. C. Joy, D. C. Joy Department of Metallurgy, University of OxfordSearch for more papers by this authorM. N. Thompson, M. N. Thompson N.V. Philips Electron Optics, P.I.T., TQV-1, EindhovenSearch for more papers by this authorG. R. Booker, G. R. Booker Department of Metallurgy, University of OxfordSearch for more papers by this authorW. H. J. Andersen, W. H. J. Andersen N.V. Philips Electron Optics, P.I.T., TQV-1, EindhovenSearch for more papers by this author D. C. Joy, D. C. Joy Department of Metallurgy, University of OxfordSearch for more papers by this authorM. N. Thompson, M. N. Thompson N.V. Philips Electron Optics, P.I.T., TQV-1, EindhovenSearch for more papers by this authorG. R. Booker, G. R. Booker Department of Metallurgy, University of OxfordSearch for more papers by this authorW. H. J. Andersen, W. H. J. Andersen N.V. Philips Electron Optics, P.I.T., TQV-1, EindhovenSearch for more papers by this author First published: 16 January 1974 https://doi.org/10.1002/pssa.2210210144Citations: 8AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume21, Issue116 January 1974Pages K1-K5 RelatedInformation
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