Probe-type thin-film head for perpendicular recording using multilayered Fe-Si-Ru films
1985; American Institute of Physics; Volume: 57; Issue: 8 Linguagem: Inglês
10.1063/1.335485
ISSN1520-8850
AutoresY. Shiroishi, Kazuo Shiiki, Isamu Yuitoo, Noriyuki Kumasaka, Mitsuhiro Kudo,
Tópico(s)Copper Interconnects and Reliability
ResumoThe coercivity dependence of read/write and noise characteristics are investigated for the probe-type thin-film head using multilayered Fe-Si-Ru films and Co-Cr/Co-Zr-Mo double-layer media. The D50 recording density of 100 kFCI (flux change per inch) and the output of 0.24 μVpp/μm turn m/s are obtained for the medium with the coercivity of 500 Oe. These characteristics are superior to those for conventional ring head (D50=80 kFCI, E1k=0.12 μVpp/μm turn m/s). Further, thin-film heads have low noise and high overwrite characteristics.
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