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Identification of oxidation states of copper in mixed oxides and chlorides using ESCA

1989; Elsevier BV; Volume: 44; Issue: 6 Linguagem: Inglês

10.1016/0584-8547(89)80137-5

1873-3565

Vijay Kumar Kaushik,

X-ray Diffraction in Crystallography

X-ray photoelectron spectra (XPS) of copper compounds, namely Cu2O, CuO, CuCl and CuCl2, have been investigated along with that of metallic copper to identify mixed oxidation states. Cu(2p) photoelectron and Cu LMM Auger transitions have been measured precisely. These values with Peak Synthesis data of the Cu(2p32) photoelectron lines have been used for an identification of oxidation states in a mixture.