An introduction to superconducting tunnel junction detectors
2000; Wiley; Volume: 29; Issue: 2 Linguagem: Inglês
10.1002/(sici)1097-4539(200003/04)29
ISSN1097-4539
Autores Tópico(s)Advanced Semiconductor Detectors and Materials
ResumoX-Ray SpectrometryVolume 29, Issue 2 p. 137-146 Tutorial An introduction to superconducting tunnel junction detectors Masahiko Kurakado, Corresponding Author Masahiko Kurakado Electronics and Applied Physics, Osaka Electro-Communication University, 18-8, Hatsucho, Neyagawa, Osaka 572-8530, JapanElectronics and Applied Physics, Osaka Electro-Communication University, 18-8, Hatsucho, Neyagawa, Osaka 572-8530, Japan.Search for more papers by this author Masahiko Kurakado, Corresponding Author Masahiko Kurakado Electronics and Applied Physics, Osaka Electro-Communication University, 18-8, Hatsucho, Neyagawa, Osaka 572-8530, JapanElectronics and Applied Physics, Osaka Electro-Communication University, 18-8, Hatsucho, Neyagawa, Osaka 572-8530, Japan.Search for more papers by this author First published: 21 March 2000 https://doi.org/10.1002/(SICI)1097-4539(200003/04)29:2 3.0.CO;2-5Citations: 5AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract Superconducting tunnel junction (STJ) detectors have potential as ultra-high-energy resolution detectors. Recently, single-junction detectors, where radiation is directly absorbed and detected by an STJ, have shown much higher energy resolutions than semiconductor detectors even at high count rates of over 104 counts per second, e.g. resolutions of 12 eV for 5.9 keV x-rays, 6 eV for 277 eV x-rays and 0.2 eV for 2 eV optical photons. The energy resolutions of series-junction detectors, where radiation is absorbed by a single-crystal substrate and the resulting non-thermal phonons are detected by STJs connected in series on the substrate, are not yet better than those of semiconductor detectors but are improving rapidly. This paper briefly introduces some principles of STJ detectors and reviews their recent developments. Copyright © 2000 John Wiley & Sons, Ltd. REFERENCES 1Kurakado M. X-Ray Spectrom.1999; 28: 389. 2Wood GH, White BL. Appl. Phys. Lett. 1969; 15: 237. 3Wood GH, White BL. Can. J. Phys. 1973; 51: 2032. 4Kurakado M. J. Appl. Phys. 1984; 55: 3185. 5Barone A, Darbo G, De Stefano S, Gallinaro G, Siri S, Vaglio R, Vitale S. Nucl. Instrum. Methods A 1985; 234: 61. 6Twerenbold D. Europhys. Lett. 1986; 1: 209. 7Tinkham M. Introduction to Superconductivity, McGraw-Hill: New York, 1975. 8Rothwarf A, Taylor BN. Phys. Rev. Lett. 1967; 19: 27. 9Rothmund W, Zehnder A. In Superconductive Particle Detectors, A Barone (ed.). World Scientific: Singapore, 1988; 52. 10Frank M, Mears CA, Labov SE, Azgui F, Lindeman MA, Hiller LJ, Netel H, Barfknecht AT. Nucl. Instrum. Methods A 1996; 370: 41. 11Mears CA, Labov SE, Frank M, Lindeman MA, Hiller LJ, Netel H, Barfknecht AT. Nucl. Instrum. Methods A 1996; 370: 53. 12Kurakado M, Takahashi T, Matsumura A. Appl. Phys. Lett. 1990; 57: 1933. 13Bardeen J, Cooper LN, Schrieffer JR. Phys. Rev. 1957; 108: 1175. 14Kurakado M, Mazaki H. Phys. Rev. B 1980; 22: 168. 15Klein CA. J. Appl. Phys. 1968; 39: 2029. 16Kurakado M, Mazaki H. Nucl. Instrum. Methods 1981; 185: 141. 17Kurakado M. Nucl. Instrum. Methods 1982; 196: 275. 18Chang JJ, Scalapino DJ. Phys. Rev. B 1977; 15: 2651. 19McMillan WL, Rowell JM. In Superconductivity, RD Parks (ed.). Marcel Dekker: New York, 1969. 20Kaplan SB, Chi CC, Langenberg DN, Chang JJ, Jafarey S, Scalapino DJ. Phys. Rev. B 1976; 14: 4854. 21Kurakado M. unpublished thesis, Kyoto University, 1981. 22Booth NE. Appl. Phys. Lett. 1997; 50: 293. 23Frank M, Hiller LJ, le Grand JB, Mears CA, Labov SE, Lindeman MA, Netel H, Chow D, Barfknecht AT. Rev. Sci. Instrum. 1998; 69: 25. 24Verhoeve P, Rando N, Peacock A, van Dordrecht A, Poelaert A, Goldie DJ. IEEE Trans. Appl. Supercond. 1997; 7: 3359. 25Gray KE. Appl. Phys. Lett. 1978; 32: 392. 26Kurakado M, Takahashi T, Matsumura A. J. Low Temp. Phys. 1993; 93: 567. 27Mears CA, Labov SE, Barfknecht AT. Appl. Phys. Lett. 1993; 63: 2961. 28Goldie DJ, Brink PL, Patel C, Booth NE, Salmon GL. Appl. Phys. Lett. 1994; 64: 3169. 29Hettl P, Angloher G, Feilitzsch Fv,Höhne J,Jochum J,Kraus H,Mössbauer RL. X-Ray Spectrom.1999; 28: 309. 30Kurakado M, Matsumura A, Takahashi T, Ito S, Katano R, Isozumi Y. Proc. SPIE 1992; 1743: 351 the resolution 114 eV of the single-junction detector was not published. 31Ukibe M, Kishimoto M, Katagiri M, Kurakado M, Nakazawa M. Nucl. Instrum. Methods A 1997; 401: 299. 32Mears CA, Labov SE, Frank M, Netel H, Hiller LJ, Lindeman MA, Chow D, Barfknecht AT. IEEE Trans. Appl. Supercond. 1997; 7: 3415. 33Wollman DA, Irwin KD, Hilton GC, Dulcie LL, Newbury DE, Martinis JM. J. Microsc. 1997; 188: 196. 34Kraus H, Feilitzsch Fv, Jochum J, Mössbauer RL, Peterreins Th, Pröbst F. Phys. Lett. B 1989; 231: 195. 35Gaidis MC, Friedrich S, Segall K, Prober DE, Szymkowiak AE, Moseley SH. IEEE Trans. Appl. Supercond. 1996; 6: 1. 36Kurakado M, Matsumura A, Takahashi T, Ito S, Katano R, Isozumi Y. Rev. Sci. Instrum. 1991; 62: 156. 37Kurakado M, Ohsawa D, Katano R, Ito S, Isozumi Y. Rev. Sci. Instrum. 1997; 68: 3685. 38Katagiri M, Kishimoto M, Ukibe M, Kurakado M, Kraus H, Maehata K, Ishibashi K, Nakamura T, Nakazawa M. In Proceedings of the 7th International Workshop on Low Temperature Detectors, S Cooper (ed.). 1997; 39 available from [email protected]. 39Ukibe M, Kishimoto M, Katagiri M, Kurakado M, Nakamura T, Nakazawa M. Nucl. Instrum. Methods A 1998; 402: 95. 40Cristiano R, Esposito E, Frunzo L, Lisitskii M, Monaco A, Nappi C. In Proceedings of the 7th International Workshop on Low Temperature Detectors, S Cooper (ed.). 1997; 37 available from [email protected]. 41Nappi C, Cristiano R. Appl. Phys. Lett. 1997; 70: 1320. Citing Literature Volume29, Issue2March/April 2000Pages 137-146 ReferencesRelatedInformation
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