Defect characterization and detection in Langmuir-Blodgett films
1987; Elsevier BV; Volume: 152; Issue: 1-2 Linguagem: Inglês
10.1016/0040-6090(87)90414-7
ISSN1879-2731
AutoresP. Lesieur, A. Barraud, M. Vandevyver,
Tópico(s)Force Microscopy Techniques and Applications
ResumoThe Langmuir-Blodgett technique enables the production of ultrathin organic films. These layers are known for their high quality and well-organized structure. However, defects are present in them. In the present paper a review is given of the different types of defects together with their electrical characterization and their visualization by optical or electron microscopy. Several examples of decoration techniques and the importance of the defects for various applications are also presented.
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