Portal de Periódicos da CAPES

SIMULTANEOUS MEASUREMENT OF TWO DIFFERENT TARGETS BY MEANS OF VACUUM AND IN-AIR PIXE

2008; World Scientific; Volume: 18; Issue: 01n02 Linguagem: Inglês

10.1142/s0129083508001284

1793-6616

K. Sera, Tomoya Sasaki, J. Itoh, Y. SAITOH, S. FUTATSUGAWA,

Electron and X-Ray Spectroscopy Techniques

A simultaneous measuring system of two different targets by in-vacuum and in-air PIXE has been developed in order to improve efficiency of analyses in the limited machine time. The proton beam passes through a thin target in vacuum and it allows us to perform in-vacuum PIXE, and the beam is further transported to the in-air PIXE system for analyzing another target. The beam intensity for in-air PIXE while performing in-vacuum PIXE is 1.5 nA, which is almost sufficient. The effect of slight changes in the beam transport parameters on the background X-rays for both in-vacuum and in-air PIXE has been found to be negligible. As a result, it is confirmed that accuracy and sensitivity of analysis for many kinds of sample, such as various samples in earth, environmental sciences and in bio-medicine, are almost unchanged for the both systems, and a four-detector-simultaneous measuring system has been completed. It is expected that the system will work miracle for solving the problem of deficient machine time in our laboratory.