Analytic representations of the dielectric functions of materials for device and structural modeling
1998; Elsevier BV; Volume: 313-314; Linguagem: Inglês
10.1016/s0040-6090(97)00799-2
ISSN1879-2731
AutoresJ. M. Leng, Jon Opsal, Haifeng Chu, Michael W. Senko, D. E. Aspnes,
Tópico(s)Semiconductor Quantum Structures and Devices
ResumoAnalytic representations of the dielectric function ε are needed for the analysis of optical data of complex materials and structures. Here, we examine various harmonic-oscillator-based representations of the dielectric functions of the silicon-related materials, crystalline Si, amorphous Si, and silicon nitride. For crystalline semiconductors we develop a new representation with a prefactor proportional to ω−2, the expected response for materials with wavefunctions that are eigenfunctions of the momentum operator.
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