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Precision measurements of X- and gamma-ray intensities in 192Ir, 160Tb, 169Yb and 152Eu decays

1986; Elsevier BV; Volume: 245; Issue: 2-3 Linguagem: Inglês

10.1016/0168-9002(86)91281-7

1872-9576

Devinder Mehta, M. L. Garg, J. B. Singh, Nirmal Singh, T.S. Cheema, P.N. Trehan,

Radioactive Decay and Measurement Techniques

The relative intensities of X-rays and gamma-rays in the decays of 192Ir, 160Tb, 169Yb and 152Eu have been measured with better precision using a coaxial 64.1 cm3 high-purity Ge(HPGe) detector, a 28.27 mm2 × 5.0 mm vertical plane HPGe detector and a 28.27 mm2 × 5.5 mm vertical Si(Li) detectors. The intensities of different K and L X-rays in 160Tb decay and different L X-rays in 152Eu and 169Yb decays are measured for the first time. This set of sources can be used for the efficiency calibration of semiconductor detectors over the energy range 5–1400 keV.