Low energy SIMS study on multi-built-up layer of cobalt(II) stearate
1983; Elsevier BV; Volume: 133; Issue: 1 Linguagem: Inglês
10.1016/0039-6028(83)90471-5
ISSN1879-2758
AutoresFumitoshi Toyokawa, Hiroshi Abe, Keiichi Furuya, Tadashi Kikuchi,
Tópico(s)Electron and X-Ray Spectroscopy Techniques
ResumoThe surface of multi-built-up layer of cobalt(II) stearate on copper substrate has been studied by means of low energy SIMS. The sampling surfaces were impacted with 700 eV, 8 × 10−7 Å/cm2, Ar+ ions. In each group (odd-numbered accumulated and even-numbered accumulated samples), the 58Co+ intensities at the initial bombardment responded to the number of the accumulation, respectively. The 58Co+ ion intensities from even-numbered accumulated samples were observed more than the expected values from a proportionality between the accumulation number and 58Co+ intensities.
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