Direct measurement of He + ions produced by Compton scattering between 2.5 and 5.5 keV
1994; American Physical Society; Volume: 72; Issue: 21 Linguagem: Inglês
10.1103/physrevlett.72.3329
ISSN1092-0145
AutoresJames A. R. Samson, Zhiwei He, R. J. Bartlett, M. Sagurton,
Tópico(s)Radiation Shielding Materials Analysis
ResumoThe relative cross sections for Compton scattering have been measured between 2.5 and 5.5 keV. By measuring the number of ${\mathrm{He}}^{+}$ ions produced with near zero recoil energies it was possible to identify ions produced by Compton scattering from those produced by photoionization. The results have been placed on an absolute basis by normalization to recent calculations.
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