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A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers

1997; Wiley; Volume: 204; Issue: 1 Linguagem: Inglês

10.1002/1521-3951(199711)204

1521-3951

Ulrich Hohenester, P. Kočevar, P. L. de Andrés, F. Florès,

Surface and Thin Film Phenomena

physica status solidi (b)Volume 204, Issue 1 p. 397-399 Research Article A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers U. Hohenester, U. Hohenester [email protected] Institut für Theoretische Physik, Karl-Franzens-Universität, A-8010 Graz, AustriaSearch for more papers by this authorP. Kocevar, P. Kocevar Institut für Theoretische Physik, Karl-Franzens-Universität, A-8010 Graz, AustriaSearch for more papers by this authorP. de Andrés, P. de Andrés Instituto de Ciencia de Materiales (CSIC), E-28049 Madrid, SpainSearch for more papers by this authorF. Flores, F. Flores Departamento de Fisica de la Materia Condensada, Universidad Autónoma, E-28049 Madrid, SpainSearch for more papers by this author U. Hohenester, U. Hohenester [email protected] Institut für Theoretische Physik, Karl-Franzens-Universität, A-8010 Graz, AustriaSearch for more papers by this authorP. Kocevar, P. Kocevar Institut für Theoretische Physik, Karl-Franzens-Universität, A-8010 Graz, AustriaSearch for more papers by this authorP. de Andrés, P. de Andrés Instituto de Ciencia de Materiales (CSIC), E-28049 Madrid, SpainSearch for more papers by this authorF. Flores, F. Flores Departamento de Fisica de la Materia Condensada, Universidad Autónoma, E-28049 Madrid, SpainSearch for more papers by this author First published: 16 November 2001 https://doi.org/10.1002/1521-3951(199711)204:1 3.0.CO;2-3Citations: 7AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract A systematic transport study of the ballistic electron emission microscopy (BEEM) of Au/Si(100) and Au/Si(111) Schottky barriers for different thicknesses of the metal layer and different temperatures is presented. It is shown that the existing experimental data are compatible with a recently predicted band structure-induced non-forward electron propagation through the Au(111) layer. References 1 W. Kaiser and L. Bell, Phys. Rev. Lett. 60, 1406 (1988); Phys. Rev. Lett. 61, 2368 (1988). 2 M. Prietsch, Phys. Rep. 253, 163 (1995). 3 L. Schowalter and E. Lee, Phys. Rev. B 43, 9308 (1991). 4 P. de Andrés, F. Garcia-Vidal, D. Sestovic, and F. Flores, Physica Scripta T66, 277 (1996). 5 U. Hohenester et al., Phys. Rev. B 47, 13233 (1993). 6 F. Blatt, Physics of Electronic Conduction in Solids, McGraw-Hill Publ. Co., New York 1968. 7 L. Bell, Phys. Rev. Lett. 77, 3893 (1996). 8 U. Hohenester, P. Kocevar, P. de Andrés, and F. Flores, Proc. MSM-10, Oxford 1997, in print. 9 E. Lee and L. Schowalter, Phys. Rev. B 45, 6325 (1992). 10 C. A. Ventrice et al., Appl. Surf. Sci. 104/105, 274 (1996). 11 T. Kalka, M. Dähne-Prietsch, and G. Kaindl, Proc. ICPS-23, Eds. M. Scheffler and R. Zimmermann, World Scientific Publ. Co., Singapore 1996 (p. 1015). 12 C. Manke, Diploma Thesis, Univ. Nürnberg-Erlangen, 1995. 13 H. Palm, Ph. D. Thesis, Friedrich-Alexander Univ. Nürnberg-Erlangen, 1994. 14 C. Girardin et al., J. Physique III 6/5, 661 (1996). Citing Literature Volume204, Issue1November 1997Pages 397-399 ReferencesRelatedInformation