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Atomic imaging of cage-like structures of silicon

1994; Wiley; Volume: 146; Issue: 1 Linguagem: Inglês

10.1002/pssa.2211460111

1521-396X

L. C. Nistor, G. Van Tendeloo, S. Amelinckx, C. Cros,

Crystallography and Radiation Phenomena

physica status solidi (a)Volume 146, Issue 1 p. 119-132 Real Structure of Solids Atomic imaging of cage-like structures of silicon† L. Nistor, L. Nistor Electron Microscopy for Materials Research, University of Antwerp (RUCA) On leave from the Institute of Atomic Physics, P.O. Box Mg-6, Magurele, 76900 Bucharest, Romania.Search for more papers by this authorG. van Tendeloo, G. van Tendeloo Electron Microscopy for Materials Research, University of Antwerp (RUCA) Search for more papers by this authorS. Amelinckx, S. Amelinckx Electron Microscopy for Materials Research, University of Antwerp (RUCA) Search for more papers by this authorC. Cros, C. Cros Laboratoire de Chimie du Solide du CNRS, Talence Search for more papers by this author L. Nistor, L. Nistor Electron Microscopy for Materials Research, University of Antwerp (RUCA) On leave from the Institute of Atomic Physics, P.O. Box Mg-6, Magurele, 76900 Bucharest, Romania.Search for more papers by this authorG. van Tendeloo, G. van Tendeloo Electron Microscopy for Materials Research, University of Antwerp (RUCA) Search for more papers by this authorS. Amelinckx, S. Amelinckx Electron Microscopy for Materials Research, University of Antwerp (RUCA) Search for more papers by this authorC. Cros, C. Cros Laboratoire de Chimie du Solide du CNRS, Talence Search for more papers by this author First published: 16 November 1994 https://doi.org/10.1002/pssa.2211460111Citations: 14 † Dedicated to Professor Dr. Dr. h.c. HEINZ BETHGE on the occasion of his 75th birthday § Groenenborgerlaan 171, B-2020 Antwerpen, Belgium. ¶ 351, cours de la Libération, F-33405 Talence Cedex, France. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstracten Two types of cubic siliconsodium compounds Na8Si46 and NaxSi136 (x < 11) formed by the stacking of tetrahedrally bound silicon polyhedra are studied by high resolution electron microscopy. The channels in both structures are directly revealed and depending on the type of polyhedra a tenfold or a twelvefold coordination is observed in projection. In the Na8Si46 compound no extended defects are observed, while in the NaxSi136 compound a high density of twins and stacking faults are present. The defect configuration is similar to the one observed in other diamond like structures. Abstractfr Deux types de phases cubiques à base de silicium et sodium: Na8Si46 et NaxSi136 (x < 11) ont été étudiés par microscopie électronique haute résolution. Les composés sont formés par ľenchainement de polyhèdres ďatomes de silicium liés entre eux de façon tétraédrique. Les canaux de ces deux structures sont directement révelés. On observe en projection une coordination ďordre dix ou douze qui depend du type de polyhèdre. Dans le composé Na8S46 aucun défaut étendu n'a été observé, alors que dans la phase NaxSi136 une grande densité de macles et de défauts ďempilement est présente. La configuration des défauts est similaire à celle qui est observée dans ďautres structures de type diamant. References 1 J. S. Kasper, P. Hagenmuller, M. Pouchard, and C. Cros, Science 150, 1713 (1965). 2 C. Cros, M. Pouchard, P. Hagexmuller, and J. S. Kasper, Bull. Soc. Chim. France 7, 2737 (1968). 3 C. Cros, M. Pouchard, and P. Hagenmuller, Bull. Soc. Chim. France 2, 379 (1971). 4 J. Gallmeir, H. Schafer, and A. Weis, Z. Naturf. 216, 665 (1969). 5 L. Pauling and R. E. Marsh, Proc. Nat. Acad. Sci. USA 38, 112 (1952). 6 C. Cros, Thesis no. 271, University of Bordeaux 1970. 7 C. Cros and J. C. Benejat, Bull. Soc. Chim. France 5, 1739 (1972). 8 G. Van Tendeloo, J. Van Landuyt, S. Amelinckx, and S. Ranganathan, J. Microscopy 149, 1 (1988). 9 W. Luyten, G. Van Tendeloo, S. Amelinckx, and J. L. Collins, Phil. Mag. A66, 899 (1992). 10 G. V. S. Sastry, C. Suryanarayara, M. Van Sande, and G. Van Tendeloo, Mater. Res. Bull. 13, 1065 (1978). 11 G. Van Tendeloo, J. Van Landuyt, S. Amelinckx, and S. Rangarathan, J. Microscopy 149, 1 (1988). 12 D. Shechtman, J. L. Hutchison, L. H. Robins, E. N. Farabaugh, and A. Feldman, J. Mater. Res. 8, 473 (1993). 13 N. Thompson, Proc. Phys. SOC. 40, 1014 (1951). 14 S. Muto, G. Van Tendeloo, and S. Amelinckc, Phil. Mag. B67, 443 (1993). 15 X. B. Zhang, X. F. Zhang, S. Amelinckx, and H. Werner, Appl. Phys. A58, 107 (1994). 16 D. Bernaerts, private communication. Citing Literature Volume146, Issue116 November 1994Pages 119-132 ReferencesRelatedInformation