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An atomic force microscope (AFM) and tapping mode AFM study of the solvent-induced crystallization of polycarbonate thin films

1996; Wiley; Volume: 34; Issue: 1 Linguagem: Inglês

10.1002/(sici)1099-0488(19960115)34

1099-0488

Hamish Robert Harron, R.G. Pritchard, B. C. Cope, D.T. Goddard,

Force Microscopy Techniques and Applications

Thin films of bisphenol-A polycarbonate (PC) were progressively crystallized in a controllable manner under the action of an appropriate plasticizing agent. No conducting layer was applied to the polymer surface, so that imaging with the atomic force microscope (AFM) left the sample exposed for additional plasticizer treatment. The PC sample was observed many times throughout the crystallization process using the AFM in both the contact and tapping modes. Data regarding the growth process for spherulites in addition to high-resolution morphology studies were achieved. © 1996 John Wiley & Sons, Inc.