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The Zanazzi-Jona and Pendry reliability indices compared in LEED crystallographic analyses for five surfaces

1982; IOP Publishing; Volume: 15; Issue: 3 Linguagem: Inglês

10.1088/0022-3719/15/3/001

1747-3802

William Thomas Moore, D.C. Frost, K.A.R. Mitchell,

Electron and X-Ray Spectroscopy Techniques

Topmost interlayer spacings and three measures of their associated uncertainties obtained with the reliability index proposed recently by Pendry (1980) are compared with results available from the authors' previous analyses with the reliability index proposed by Zanazzi and Jona for the surfaces Ni(311), Cu(311), Zr(0001), Rh(110)-c(2*2)-S and Rh(100)-(2*2)-S. Structural conclusions are essentially identical from both approaches. Advantages of the Pendry approach include its much shorter times for computation, and its tendency to give lower uncertainties for the interlayer spacing.