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Non-destructive XRF analysis of selected Flemish panel paintings in the Fine Arts Museum of Seville

2014; Taylor & Francis; Volume: 37; Issue: 2 Linguagem: Inglês

10.1080/19455224.2014.915224

1945-5232

Anabelle Križnar, Maria del Valme Muñoz, F. de la Paz, M.Á. Respaldiza, Isolda Luna‐Vega,

Conservation Techniques and Studies

The aim of this research was the analysis of selected Flemish panel paintings from the collection of the Fine Arts Museum of Seville, Spain, with the purpose of obtaining information about the painting materials applied and to discover any possible similarities among the artists. Artworks from the sixteenth century by Pieter Aertsen, Marcellus Coffermans, Pieter Coecke and a Master of Female Half-Lengths were selected. For the analysis, non-destructive X-Ray Fluorescence (XRF) was used. The results show that the palette of all four artists was quite similar; however several important differences between them were discovered. Later interventions on the paintings were confirmed, as well as the chemical deterioration of some pigments that has altered the appearance of images on some panels. The importance of this study is the possibility of comparison with similar artworks in other collections, bearing in mind the importance and influence that Flemish painting had on European art in the sixteenth and seventeenth centuries.