Determination of the specific resistance of individual freestanding ZnO nanowires with the low energy electron point source microscope
2007; American Institute of Physics; Volume: 91; Issue: 25 Linguagem: Inglês
10.1063/1.2827563
ISSN1520-8842
AutoresDirk Henning Weber, André Beyer, B. Völkel, Armin Gölzhäuser, E. Schlenker, A. Bakin, A. Waag,
Tópico(s)Quantum Dots Synthesis And Properties
ResumoA low energy electron point source microscope is used to determine the electrical conductivity of freestanding ZnO nanowires. The nanowires were contacted with a manipulation tip and I-V curves were taken at different wire lengths. From those, the specific resistance was calculated and separated from the contact resistance. By comparing the specific resistances of ZnO nanowires with diameters between 1100 and 48nm, a large surface contribution for the thin nanowires was found. A geometric model for separation between surface and bulk contributions is given.
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