Portal de Periódicos da CAPES

Application and calibration of a quartz needle sensor for high resolution scanning force microscopy

1999; American Institute of Physics; Volume: 17; Issue: 4 Linguagem: Inglês

10.1116/1.590751

1520-8567

W. Clauß, J. Zhang, D. J. Bergeron, A. T. Charlie Johnson,

Mechanical and Optical Resonators

We have investigated a force sensing technique for high-resolution scanning force microscopy which uses a piezoelectric quartz resonator oscillating perpendicular to the direction of the sample surface at a frequency of 1 MHz. The achievement of true atomic resolution on single-wall carbon nanotube surfaces illustrates the promises of this new technique which is especially well suited for ultrahigh vacuum or low-temperature conditions. The force sensitivity and the mechanical amplitude of the sensor oscillation were characterized semiquantitatively.