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Measurement of LEED intensities with a modified closed-circuit television system

1980; IOP Publishing; Volume: 13; Issue: 3 Linguagem: Inglês

10.1088/0022-3735/13/3/014

2051-5685

H. Leonhard, A. Gutmann, K. Hayek,

Integrated Circuits and Semiconductor Failure Analysis

A simple and inexpensive method to record and process low-energy electron diffraction (LEED) intensities (I-V curves) is presented. A closed-circuit television system and an electronic interface allow the selection of one spot at a time. The raw data are corrected for background, beam current and transmission of the LEED optics. The intensities can be measured directly from the screen or from a television recorder.