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BIBTEX RIS

Three-Dimensional Characterization of Microstructure by Electron Back-Scatter Diffraction

2007; Annual Reviews; Volume: 37; Issue: 1 Linguagem: Inglês

10.1146/annurev.matsci.37.052506.084401

ISSN

1545-4118

Autores

Anthony D. Rollett, S.-B. Lee, Robert Campman, Gregory S. Rohrer,

Tópico(s)

Microstructure and mechanical properties

Resumo

The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed.

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