The growth of dislocation-free crystals of benzil
1985; Elsevier BV; Volume: 73; Issue: 2 Linguagem: Inglês
10.1016/0022-0248(85)90294-5
ISSN1873-5002
Autores Tópico(s)Crystallization and Solubility Studies
ResumoDislocation-free crystals of benzil have been obtained by repeated Czochralski growth and have been characterized using X-ray diffraction topography. At each stage of growth, the parts containing the defects were etched off and the rest was used for the seed in the next growth. The growth behaviour could be interpreted in connection with the shape of the solid-liquid interface. The double image of the screw dislocation could be explained elementarily and it was concluded that the Burgers vector was c/3.
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