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X-ray diffraction line profile analysis of nanocrystalline graphite

2008; Elsevier BV; Volume: 111; Issue: 2-3 Linguagem: Inglês

10.1016/j.matchemphys.2008.04.024

1879-3312

Adriyan Milev, Michael A. Wilson, G. S. Kamali Kannangara, Nguyen H. Tran,

Graphene research and applications

The structure evolution to nanocrystalline graphite produced by ball milling in n-dodecane has been studied by Fourier analysis of broadened X-ray diffraction line profiles according to double-Voigt method. The Fourier analysis gave size and strain distributions of the coherently diffracting domains (X-ray crystallite size) and root-mean-square-strain (rmss) and their average values. The precursor graphite was defined by average crystal sizes of about hundreds of nanometers, measured along the in-plane and out-of-plane directions, and low rmss value of 0.38 × 10−3. During milling, the average crystallite sizes of graphite decreased to about 6 and 43 nm along the out-of-plane and in-plane directions, respectively. Correspondingly, the rmss of milled graphite increased to 6.54 × 10−3. Analysis of the out-of-plane to in-plane crystallite size ratios showed that the crystallites became progressively thinner and flatter. A linear relationship between rmss and reciprocal crystallite size along the stacking axis revealed that size of disordered boundary regions gradually increased at the expense of ordered crystalline regions. A model describing crystalline–nanocrystalline transformation of graphite along different crystallographic axis was formulated and used to discuss the experimental data. It was concluded that a distortion-controlled process is responsible for the crystalline–nanocrystalline transformation of graphite milled in n-dodecane.