Artigo
Selfconsistent Analysis of Mobility-Lifetime Products and Subgap Absorption on Different PECVD A-SI:H Films
1997; Cambridge University Press; Volume: 467; Linguagem: Inglês
10.1557/proc-467-233
ISSN1946-4274
AutoresLicheng Jiao, S. Semoushikina, Yeeheng Lee, C. R. Wroński,
Tópico(s)Integrated Circuits and Semiconductor Failure Analysis
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