The influence of A-site rare-earth for barium substitution on the chemical structure and ferroelectric properties of BZT thin films
2009; Elsevier BV; Volume: 182; Issue: 10 Linguagem: Inglês
10.1016/j.jssc.2009.07.013
ISSN1095-726X
AutoresC. Ostos, M. L. Martínez‐Sarrión, L. Mestres, Eduardo Hurtado Delgado, P. Prieto,
Tópico(s)Electronic and Structural Properties of Oxides
ResumoRare-earth (RE) doped Ba(Zr,Ti)O3 (BZT) thin films were prepared by rf-magnetron sputtering from a Ba0.90Ln0.067Zr0.09Ti0.91O3 (Ln=La, Nd) target. The films were deposited at a substrate temperature of 600 °C in a high oxygen pressure atmosphere. X-ray diffraction (XRD) patterns of RE-BZT films revealed a 〈001〉 epitaxial crystal growth on Nb-doped SrTiO3, 〈001〉 and 〈011〉 growth on single-crystal Si, and a 〈111〉-preferred orientation on Pt-coated Si substrates. Scanning electron microscopy (SEM) showed uniform growth of the films deposited, along with the presence of crystals of about half-micron size on the film's surface. Transmission electron microscopy (TEM) evidenced high crystalline films with thicknesses of about 100 nm for 30 min of sputtering. Electron-probe microanalysis (EPMA) corroborated the growth rate (3.0–3.5 nm/min) of films deposited on Pt-coated Si substrates. X-ray photoelectron spectroscopy (XPS), in depth profile mode, showed variations in photoelectron Ti 2p doublet positions at lower energies with spin-orbital distances characteristic of BaTiO3-based compounds. The XPS analysis revealed that lanthanide ions positioned onto the A-site of the BZT-perovskite structure increasing the MO6-octahedra distortion (M=Ti, Zr) and, thereby, modifying the Ti–O binding length. Polarization-electric field hysteresis loops on Ag/RE-doped BZT/Pt capacitor showed good ferroelectric behavior and higher remanent polarization values than corresponding non-doped system.
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