AN ELECTROSTATIC PARALLEL-PLATE ELECTRON-ENERGY SELECTOR FOR DETERMINATIONS OF CRITICAL IONIZATION POTENTIALS BY ELECTRON IMPACT
1963; Elsevier BV; Linguagem: Inglês
10.1016/b978-0-08-009775-6.50047-5
Autores Tópico(s)Ion-surface interactions and analysis
ResumoAn ion-source employing an electron beam of narrow energy spread is described. The method of beam-energy selection and analysis consists of passing the beam through an electric field determined by a potential placed across two plane-parallel conducting plates. A selected electron beam of 10·0 V energy was found to have an energy distribution with a 0·063 V width at half-peak value. The ion-source was used with a 12-in. radius 60°-sector type of direction-focusing mass spectrometer. A method for electronically differentiating an ion-appearance-potential curve is presented. Initial data are presented for formation of Ar+ near its appearance potential as a test of the efficacy of the instrumentation. A tentative explanation of the results is presented.
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