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ICP Etching of 4H-SiC Substrates

2013; Trans Tech Publications; Volume: 740-742; Linguagem: Inglês

10.4028/www.scientific.net/msf.740-742.825

1662-9760

J. Biscarrat, Jean-François Michaud, Emmanuel Collard, Daniel Alquier,

Copper Interconnects and Reliability

Due to its inert chemical nature, plasma etching is the most effective technique to pattern SiC. In this paper, dry etching of 4H-SiC substrate in Inductively Coupled Plasma (ICP) has been studied in order to evaluate the impact of process parameters on the characteristics of etching such as etch rate and trenching effect. Key process parameters such as platen power and ICP coil power prove to be essential to control the SiC etch rate. On the other hand, the ICP coil power and the working pressure mainly master the trenching effect. Our results enlighten that high etch rate with minimal trenching effect can be obtained using high ICP coil power and low working pressure.