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Quartz resonator instabilities under cryogenic conditions

2012; Institute of Electrical and Electronics Engineers; Volume: 59; Issue: 1 Linguagem: Inglês

10.1109/tuffc.2012.2152

2373-7840

Maxim Goryachev, Serge Galliou, Philippe Abbé, Pierre-Yves Bourgeois, S. Grop, Benoît Dubois,

Advanced MEMS and NEMS Technologies

The phase noise of a quartz crystal resonator working at liquid helium temperatures is studied. Measurement methods and the device environment are explained. The phase noise is measured for different resonance modes, excitation levels, amount of operating time, device orientations in relation to the cryocooler vibration axis, and temperatures. Stability limits of a frequency source based on such devices are evaluated in the present measurement conditions. The sources of phase flicker and white noises are identified. Finally, the results are compared with previous works.