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High-speed optical sampling measurement of electrical wave form using a scanning tunneling microscope

1993; American Institute of Physics; Volume: 63; Issue: 26 Linguagem: Inglês

10.1063/1.110763

1520-8842

K. Takeuchi, Yukio Kasahara,

Near-Field Optical Microscopy

The optical sampling measurement of a high-speed electrical wave form using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train from a laser diode (LD) is used to turn on and off a photoconductive switch on a STM probe to measure a signal from a Schottky barrier diode (SBD) in a sampling procedure. A time resolution less than 300 ps has been achieved. This novel method has the potential to create a breakthrough in ultra-high-speed wave form measurement through this unique combination of optical sampling and STM technology.