Effects of micro-beam induced damage on single-event current measurements
1995; Elsevier BV; Volume: 104; Issue: 1-4 Linguagem: Inglês
10.1016/0168-583x(95)00414-9
ISSN1872-9584
AutoresT. Hirao, I. Nashiyama, Tomihiro Kamiya, T. Nishijima,
Tópico(s)Ion-surface interactions and analysis
ResumoRadiation damage introduced by the impact of heavy-ion micro-beams has been studied in connection with its effects on single-event transient currents, which are measured by the digitizing sampling method combined with focused ion micro-beams. It is found that the single-event currents decrease with increasing the repetition number of measurements and that there exists a linear relationship between the ion fluence and the reciprocal of the normalized single-event charge. A single-event damage equation is deduced, where the damage constant is proportional to the defect density calculated using either the Kinchin-Pease model or the TRIM code. Experimental techniques are developed to eliminate the effect of radiation damage.
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