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A fast low-power time-to-voltage converter for high luminosity collider detectors

1989; Institute of Electrical and Electronics Engineers; Volume: 36; Issue: 1 Linguagem: Inglês

10.1109/23.34493

1558-1578

Andrew Stevens, V. Budihartono, R.P. Van Berg, Jan Van der Spiegel, H. H. Williams, L. Callewaert, W. Eyckmans, Willy Sansen,

Analog and Mixed-Signal Circuit Design

A novel CMOS (complementary metal oxide semiconductor) integrated circuit has been designed to measure the time interval between two digital voltage pulses. The measurement is stored as an analog voltage on a capacitor for later digitization. The targeted range of measurable times is 5-25 ns, with a resolution of 0.5 ns. An additional feature of the circuit is a storage depth of eight samples, i.e. eight consecutive time measurements can be recorded individually. Hence, the chip is a combination of a time-to-voltage converter and an analog memory. >