Structural studies in Ge22Se68X10 (X= Bi, Sb) glasses and their amorphous films by X-ray spectroscopy
1987; Elsevier BV; Volume: 93; Issue: 2-3 Linguagem: Inglês
10.1016/s0022-3093(87)80171-0
ISSN1873-4812
AutoresA. Agnihotri, Anjani Kumar, A. N. Nigam,
Tópico(s)Crystal Structures and Properties
ResumoThe X-ray K-absorption edges of Ge and Se in glassy Ge22Se78 and Ge22Se68X10 ( X = Bi, Sb) have been studied in bulk as well as in thin films. We find that the Ge K-edge shifts in bismuth-doped glassy alloy while the Se K-edge remains unchanged. However, in Sb-doped glassy alloy the Ge K-edge remains unchanged while the Se K-edge shifts towards the lower energy side. These results indicate that Bi-Ge bonding is favoured in Ge-Se-Bi and Se-Sb bonding in Ge-Se-Sb alloys.
Referência(s)