Some effects of strain and temperature on the resistance of thin gold-glass cermet films
1972; Elsevier BV; Volume: 13; Issue: 1 Linguagem: Inglês
10.1016/0040-6090(72)90163-0
ISSN1879-2731
Autores Tópico(s)Electrical and Thermal Properties of Materials
ResumoThin gold-glass cermet films have been prepared by r.f. sputtering in an argon atmosphere. The strain sensitivity (gauge factor) and the temperature coefficient of resistance (TCR, α) have been measured for films with resistances in the range 100 ω to 1 Mω/□. Low resistance films exhibit gauge factors and TCRs consistent with a metallic conduction process whilst high resistance films exhibit gauge factors and TCRs consistent with an activated conduction process. These results are discussed in terms of the film structures observed by transmission electron microscopy. Measurements of gauge factors in the range 20°–100°C have led to the concept of a temperature coefficient of gauge factor (β). Mathematically it can be shown that β = -α. Experimental results are discussed confirming this relationship.
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