Measurements of Radiation Pressure Effect in Cryogenic Sapphire Dielectric Resonators
1997; American Physical Society; Volume: 79; Issue: 11 Linguagem: Inglês
10.1103/physrevlett.79.2141
ISSN1092-0145
AutoresSheng Chang, A.G. Mann, André N. Luiten, D. G. Blair,
Tópico(s)Advanced Frequency and Time Standards
ResumoWe report observations of the radiation pressure induced expansion of a solid dielectric resonator. This effect causes a fundamental limit to the frequency stability of the resonator. The measurements were made on four high $Q$-factor quasi-TE ``whispering gallery'' modes from 9.9 to 12.6 GHz in a monocrystalline sapphire resonator at liquid helium temperatures. The fractional frequency shift is $\ensuremath{-}1.0\ifmmode\pm\else\textpm\fi{}0.1\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}12}$ per \ensuremath{\mu}J of energy stored in the resonator. This result is consistent in sign, magnitude, and linearity with the radiation pressure induced lattice expansion term predicted by Braginsky.
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