Theory and applications of a surface inspection technique using double-pass retroreflection
1993; SPIE; Volume: 32; Issue: 9 Linguagem: Inglês
10.1117/12.143938
ISSN1560-2303
AutoresRodger L. Reynolds, Frank Karpala, Donald A. Clarke, Omer L. Hageniers,
Tópico(s)Industrial Vision Systems and Defect Detection
ResumoA historic perspective to the development of the D SIGHT ™ surface inspection technique from a laboratory curiosity to a mature technology is presented. A brief description of the experimental process that led to the discovery of the phenomenon is followed by a discussion of how the optical process functions and how varying the hardware configuration affects the system output. Illustrations of a wide variety of surfaces, imaged using double-pass retroreflection, are used to show its evolution from a purely optical, visual enhancement technique to a computer-based, image acquisition system, which, through digital image processing, enables a user to quantify, annotate, and record the quality of a given surface. Possible directions for future development are discussed briefly.
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