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Surfaces and Interfaces of High-T c Superconductors for Contact and Junction Formation Studied with Synchrotron Radiation Photoemission Spectroscopy

1988; Institute of Physics; Volume: 27; Issue: 11A Linguagem: Inglês

10.1143/jjap.27.l2233

1347-4065

Masaharu Oshima, Yasuko Yamada, Tomoaki Kawamura, Satoshi Maeyama, Kouji Hohkawa, Yasuo Tazoh, Tsuneaki Miyahara,

Superconducting Materials and Applications

Interface characteristics between contact metals or junction materials and oxide superconductors were analyzed by synchrotron radiation photoemission spectroscopy. A new surface processing technique consisting of O + ion sputtering and in-situ Au deposition processes on YBa 2 Cu 3 O y was developed to realize very low contact resistance based on these SRPES experiments. Furthermore, a strong interface reaction in the Si/YBa 2 Cu 3 O y system for junction formation was observed, suggesting that amorphous Si is not a good candidate for the junction material.