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Historical development and principles of total reflection X-ray fluorescence analysis (TXRF)

1991; Elsevier BV; Volume: 46; Issue: 10 Linguagem: Inglês

10.1016/0584-8547(91)80180-b

1873-3565

H. Aiginger,

Cultural Heritage Materials Analysis

The historical development of the physical knowledge and the practical application of total reflection X-ray fluorescence analysis (TXRF) is outlined in the introduction. The basic principles of TXRF determining physics and geometry of total-reflection sample support, total-reflection high energy cut-off filters and recent theoretical developments are described together with the principal instrumental developments and the important meetings which stimulated the development and distribution of TXRF.