Produção Nacional
Revisado por pares
Sistema para realização de medidas de luminescência com excitação por Raios X
2011; Brazilian Chemical Society; Volume: 34; Issue: 6 Linguagem: Inglês
10.1590/s0100-40422011000600024
ISSN1678-7064
AutoresMarco Aurélio Cebim, Higor Henrique de Souza Oliveira, Nilso Barelli, Marian Rosaly Davolos,
Tópico(s)Luminescence Properties of Advanced Materials
ResumoSYSTEM FOR X-RAY EXCITED OPTICAL LUMINESCENCE (XEOL) MEASUREMENTS.In this work is presented a versatile system for X-ray excited optical luminescence (XEOL) measurements.The apparatus was assembled from a sample holder connected to an optical fiber responsibly for the acquisition of the scintillation signal.The spectrum is registered with a CCD coupled in a spectrograph provided with diffraction gratings.The system performance was analyzed by exciting GdAlO 3 :Eu 3+ 3.0 at.% with X-rays from a diffractometer and measuring the emission spectra.The system can be used to obtain precise and reliable spectroscopic properties of samples with various conformations without the loss of the required safety when dealing with ionizing radiations.
Referência(s)