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Spectroscopic assessment of silica–titania and silica–hafnia planar waveguides

2004; Taylor & Francis; Volume: 84; Issue: 13-16 Linguagem: Inglês

10.1080/14786430310001644459

1478-6443

Rui M. Almeida, Ana C. Marques, S. Pelli, Giancarlo C. Righini, Alessandro Chiasera, M. Mattarelli, M. Montagna, C. Tosello, Rogéria Rocha Gonçalves, Hervé Portalès, S. Chaussedent, Maurizio Ferrari, L. Zampedri,

Photonic and Optical Devices

Silicate glasses remain the most investigated systems for optical planar waveguides, since they offer a reasonable solubility for rare-earth ions, they are transparent in the near-infrared–visible region and they are compatible with integrated optics (IO) technology. In the last decade, various technologies have been employed for the fabrication of silica (SiO2)-based IO components and a broad variety of silicate glass systems have been investigated. Besides the SiO2–titania (TiO2) system, which has been widely studied, it has recently been shown that SiO2–hafnia (HfO2) could be a further viable system for 1.5 µm applications. This paper compares spectroscopic results, in particular infrared and Raman spectra, in order to assess the structural and optical properties of erbium-activated SiO2–TiO2 and SiO2–HfO2 planar waveguides, prepared by two different techniques: rf sputtering and the sol–gel method. Particular attention is devoted to the homogeneity of the material structures obtained in each case.