Portal de Periódicos da CAPES

Artigo Produção Nacional

BIBTEX RIS

Ion induced composition changes on (110) InP cleaved surface

1994; Wiley; Volume: 141; Issue: 1 Linguagem: Inglês

10.1002/pssa.2211410129

1521-396X

J. Morais, T. A. Fazan, Richard Landers,

Electron and X-Ray Spectroscopy Techniques

physica status solidi (a)Volume 141, Issue 1 p. K19-K21 Short Note Ion induced composition changes on (110) InP cleaved surface J. Morais, J. Morais Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this authorT. A. Fazan, T. A. Fazan Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this authorR. Landers, R. Landers Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this author J. Morais, J. Morais Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this authorT. A. Fazan, T. A. Fazan Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this authorR. Landers, R. Landers Instituto de Fisica “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP Search for more papers by this author First published: 16 January 1994 https://doi.org/10.1002/pssa.2211410129Citations: 6 13083 Campinas, S.P., Brazil. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat No abstract is available for this article. References 1 H. H. Andersen, Appl. Phys. 18, 131 (1979). 2 S. Hofmann, Surface Interface Anal. 2, 148 (1980). 3 S. Hofmann, J. Vacuum Sci. Technol. B 10, 316 (1992). 4 J. B. Malherbe and W. O. Barnard, Surface Sci. 225, 309 (1991) and all references therein. 5 M. P. Seah, Thin Solid Films 81, 279 (1981). 6 D. K. Skinner, J. G. Swanson, and C. V. Haynes, Surface Interface Anal. 5, 38 (1983). 7 J. Morais, T. A. Fazan and R. Landers, Appl. Surface Sci. 72, 171 (1993). 8 F. Matsunaga, H. Kakibayashi, T. Mishima, and S. Kawase, Japan. J. appl. Phys. 27, 149 (1988). 9 G. E. McGuire, Auger Electron Spectroscopy Reference Manual, Plenum Press, New York 1979. 10 L. E. Davis, N. C. Mac Donald, P. W. Palmberg, G. E. Riach, and R. E. Weber, Handbook of Auger Electron Spectroscopy, 2nd ed., Physical Electronics, Eden Prairie 1976. Citing Literature Volume141, Issue116 January 1994Pages K19-K21 ReferencesRelatedInformation