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Interpretation of atomic force microscopy images: The mica (001) surface with a diamond tip apex

1994; American Institute of Physics; Volume: 12; Issue: 3 Linguagem: Inglês

10.1116/1.587736

1520-8567

Hao Tang, Christian Joachim, J. Devillers,

Acoustic Wave Resonator Technologies

Constant-force atomic force microscopy (AFM) images of the muscovite mica surface are calculated and compared to experimental ones. The surface structure is first optimized using a molecular mechanic procedure. Force–distance characteristics are proposed to determine the applied force range where the surface is not deformed. Calculated rigid substrate and tip apex AFM images are interpreted and compared with the experimental ones. A full relaxed calculated scan is presented and compared to rigid calculated scans.