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BIBTEX RIS

Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers

1999; Elsevier BV; Volume: 101-103; Linguagem: Inglês

10.1016/s0368-2048(98)00500-3

ISSN

1873-2526

Autores

M. Sacchi, Coryn F. Hague, S. Gota, Eric Guiot, M. Gautier-Soyer, Luca Pasquali, S. Mrowka, Eric M. Gullikson, J. H. Underwood,

Tópico(s)

X-ray Spectroscopy and Fluorescence Analysis

Resumo

We report preliminary results that illustrate the potential of resonant scattering of polarized soft X-rays applied to the study of the magnetic properties of oxide layers. As a test case, we study iron oxides, a class of materials of high technological interest, especially when prepared in the form of thin epitaxial layers.

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