Variable SAW delay line using amorphous TbFe<inf>2</inf>film
1980; IEEE Magnetics Society; Volume: 16; Issue: 5 Linguagem: Inglês
10.1109/tmag.1980.1060738
ISSN1941-0069
AutoresM. Yamaguchi, Ken‐ya Hashimoto, Hiroshi Kogo, M. Naoe,
Tópico(s)Semiconductor Quantum Structures and Devices
ResumoThis paper describes a large SAW velocity change obtained in a delay line consisting of an amorphous TbFe 2 film on a LiNbO 3 substrate. When an external bias field of about 4 kOe was applied parallel to the direction of SAW propagation, the percentage velocity change attained was -0.27 %. The value of this change is several times as large as that previously reported. The delay line may be used for trimming a small amount of delay time and tuning oscillation frequencies in an SAW oscillator.
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