Impact Ionization Coefficients of 4H-SiC
2004; Trans Tech Publications; Volume: 457-460; Linguagem: Inglês
10.4028/www.scientific.net/msf.457-460.673
ISSN1662-9760
AutoresTetsuo Hatakeyama, Takatoshi Watanabe, Kazutoshi Kojima, Nobuyuki Sano, Kazunori Shiraishi, Mitsuhiro Kushibe, Seiji Imai, Takashi Shinohe, Takaya Suzuki, Tomoyuki Tanaka, Kazuo Arai,
Tópico(s)Electromagnetic Compatibility and Noise Suppression
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